Variation of the in-plane structure with depth revealed by grazing incidence x-ray diffraction in a thin Langmuir-Blodgett film

Phys Rev E Stat Nonlin Soft Matter Phys. 2002 Jul;66(1 Pt 1):012701. doi: 10.1103/PhysRevE.66.012701. Epub 2002 Jul 18.

Abstract

Grazing incidence x-ray diffraction is used to characterize the molecular arrangement of ultrathin Langmuir-Blodgett (LB) multilayers. Using two angles of incidence of the beam allowing its penetration either throughout the complete depth of the film or only through the external layers, we show that it is possible to discriminate between the molecular packing of the deeper monolayers and that of the external monolayers of the LB film.