Imaging using inelastically scattered electrons in CTEM and STEM geometry

S D Findlay; P Schattschneider; L J Allen

doi:10.1016/j.ultramic.2007.03.003

Imaging using inelastically scattered electrons in CTEM and STEM geometry

Ultramicroscopy. 2007 Dec;108(1):58-67. doi: 10.1016/j.ultramic.2007.03.003. Epub 2007 Mar 24.

Authors

S D Findlay¹, P Schattschneider, L J Allen

Affiliation

¹ School of Physics, University of Melbourne, Victoria 3010, Australia.

PMID: 17470384
DOI: 10.1016/j.ultramic.2007.03.003

Abstract

It is shown that energy filtered transmission electron microscopy images are closely related to energy spectroscopic scanning transmission electron microscopy images. For the case of a single atom, we explore this similarity using both the coupled channels and density matrix approaches. We extend the result to the crystal case and find that the similarity persists, the limiting effects due to energy differences in the scattered electrons being small for typical specimen thicknesses in high-resolution transmission electron microscopy.