Measurements of the 82Sr half-life

L Pibida; R Fitzgerald; M Unterweger; M M Hammond; D Golas

doi:10.1016/j.apradiso.2008.11.017

Measurements of the 82Sr half-life

Appl Radiat Isot. 2009 Apr;67(4):636-40. doi: 10.1016/j.apradiso.2008.11.017. Epub 2008 Dec 7.

Authors

L Pibida¹, R Fitzgerald, M Unterweger, M M Hammond, D Golas

Affiliation

¹ National Institute of Standards and Technology, 100 Bureau Dr. Stop 8462, Gaithersburg, MD 20899, USA. leticia.pibida@nist.gov

PMID: 19155178
DOI: 10.1016/j.apradiso.2008.11.017

Abstract

Half-life of (82)Sr was measured at the National Institute of Standards and Technology (NIST) using gamma-ray spectrometry and a 4pigamma pressurized ionization chamber. The (82)Sr half-life was found to be 25.36+/-0.03 days (k=1) according to gamma-ray spectrometry and 25.34+/-0.02 days (k=1) according to the 4pigamma pressurized ionization chamber measurements.