A synchrotron study is presented in which the concept of one-dimensional tomographic reconstruction of small-angle X-ray scattering patterns is applied to investigate polyamide 6 monofilaments, dip-coated with alumina particles. The filaments are scanned with a focused synchrotron beam and the resulting scattering patterns are recorded with a PILATUS 2M detector. The reconstructed sequence of SAXS images reflects the local nanostructure variation along the filament radius. In particular, the influence of coating process parameters on the polyamide 6 is investigated.