Angled long tip to tuning fork probes for atomic force microscopy in various environments

Seiji Higuchi; Hiromi Kuramochi; Osamu Kubo; Shintaro Masuda; Yoshitaka Shingaya; Masakazu Aono; Tomonobu Nakayama

doi:10.1063/1.3569765

Angled long tip to tuning fork probes for atomic force microscopy in various environments

Rev Sci Instrum. 2011 Apr;82(4):043701. doi: 10.1063/1.3569765.

Authors

Seiji Higuchi¹, Hiromi Kuramochi, Osamu Kubo, Shintaro Masuda, Yoshitaka Shingaya, Masakazu Aono, Tomonobu Nakayama

Affiliation

¹ International Center for Materials Nanoarchitectonics (MANA), National Institute for Materials Science (NIMS), Tsukuba, Ibaraki 305-0044, Japan. HIGUCHI.Seiji@nims.go.jp

PMID: 21529007
DOI: 10.1063/1.3569765

Abstract

We expand the range of applications of a tuning fork probe (TFP) in frequency-modulation atomic force microscopy (FM-AFM) by attaching a long metal tip at a certain angle. By the combined flexure of the metal tip and the tuning fork prong, this TFP can change the direction of the detectable force by switching the resonance frequency, which has not been realized with conventional TFPs with short tips. The oscillatory behavior of the tip apex of the TFP is predicted by computer simulations and is experimentally confirmed with scanning electron microscope. FM-AFM operations using this TFP are performed in various environments, i.e., in ultrahigh vacuum, air, and water. FM-AFM images obtained at an atomic step of highly oriented pyrolytic graphite in air show a clear difference depending on the excitation frequency. It is also revealed that the higher order flexural modes of this TFP are advantageous for FM-AFM in water due to the reduction in the degree of hydrodynamic damping.