Reflective multilayer optic as hard X-ray diagnostic on laser-plasma experiment

N F Brejnholt; T A Decker; R M Hill; H Chen; G J Williams; J Park; J B Alameda; M Fernández-Perea; M J Pivovaroff; R Soufli; M-A Descalle; J Peebles; S M Kerr

doi:10.1063/1.4906509

Reflective multilayer optic as hard X-ray diagnostic on laser-plasma experiment

Rev Sci Instrum. 2015 Jan;86(1):013110. doi: 10.1063/1.4906509.

Authors

N F Brejnholt¹, T A Decker¹, R M Hill¹, H Chen¹, G J Williams¹, J Park¹, J B Alameda¹, M Fernández-Perea¹, M J Pivovaroff¹, R Soufli¹, M-A Descalle¹, J Peebles², S M Kerr³

Affiliations

¹ Lawrence Livermore National Laboratory, Livermore, California 94550, USA.
² Jacobs School of Engineering, UC San Diego, La Jolla, California 92093, USA.
³ University of Alberta, Edmonton, Alberta T6G 2R3, Canada.

PMID: 25638075
DOI: 10.1063/1.4906509

Abstract

A multilayer-based optic was tested for use as an X-ray diagnostic on a laser-plasma experiment. The multilayer optic was employed to selectively pass X-rays between 55 and 100 keV. An order of magnitude improvement in signal-to-noise ratio is achieved compared to a transmission crystal spectrometer. A multilayer response model, taking into account the source size and spectral content, is constructed and the outlook for application above 500 keV is briefly discussed. LLNL-JRNL-664311.