Initial NIST AC QHR Measurements

J Res Natl Inst Stand Technol. 2004 Aug 1;109(4):391-405. doi: 10.6028/jres.109.028. Print 2004 Jul-Aug.

Abstract

We demonstrate that dc quantized Hall resistance (dc QHR) guideline properties and dc and ac QHR values can be measured without changing sample probe lead connections at the QHR device, and report ac QHR values that converge to the dc QHR value when using four-terminal-pair ac QHR measurements. This was accomplished during one cooldown using single-series and quadruple-series connections outside the sample probe. The QHR was measured from 0 Hz to 5500 Hz in 1:1 ratio at 20 µA to ±1 part in 10(7) uncertainties with a poor-quality QHR device. A good device would allow an order of magnitude smaller uncertainties over this frequency range. We exchanged positions of the QHR device and reference resistor in the bridge and remeasured the resistance ratios to remove dominant ac bridge effects.

Keywords: ac quantum Hall effect; dc quantum Hall effect; frequency dependences; multifrequency bridge; quadruple-series connections; single-series connections.