Perspectives on in situ electron microscopy

Haimei Zheng; Yimei Zhu

doi:10.1016/j.ultramic.2017.03.022

Perspectives on in situ electron microscopy

Ultramicroscopy. 2017 Sep:180:188-196. doi: 10.1016/j.ultramic.2017.03.022. Epub 2017 Mar 29.

Authors

Haimei Zheng¹, Yimei Zhu²

Affiliations

¹ Materials Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, CA 94720, USA; Department of Materials Science and Engineering, University of California, Berkeley, CA 94720, USA. Electronic address: hmzheng@lbl.gov.
² Department of Condensed Matter Physics and Materials Science, Brookhaven National Laboratory, Upton, NY 11973, USA; Department of Physics and Astronomy, Stony Brook University, Stony Brook, NY 11790, USA.

PMID: 28434784
DOI: 10.1016/j.ultramic.2017.03.022

Abstract

In situ transmission electron microscopy (TEM) with the ability to reveal materials dynamic processes with high spatial and temporal resolution has attracted significant interest. The recent advances in in situ methods, including liquid and gas sample environment, pump-probe ultrafast microscopy, nanomechanics and ferroelectric domain switching the aberration corrected electron optics as well as fast electron detector has opened new opportunities to extend the impact of in situ TEM in broad areas of research ranging from materials science to chemistry, physics and biology. In this article, we highlight the development of liquid environment electron microscopy and its applications in the study of colloidal nanoparticle growth, electrochemical processes and others; in situ study of topological vortices in ferroelectric and ferromagnetic materials. At the end, perspectives of future in situ TEM are provided.

Keywords: Aberration correction; Colloidal nanocrystal growth; Ferroelectric vortices; Ferromagnetic domains switching; In situ TEM; Liquid cell TEM.

Publication types

Research Support, U.S. Gov't, Non-P.H.S.