Diffraction based method to reconstruct the spectrum of the Thomson scattering x-ray source

Zhijun Chi; Lixin Yan; Zhen Zhang; Zheng Zhou; Lianmin Zheng; Dong Wang; Qili Tian; Wei Wang; Zan Nie; Jie Zhang; Yingchao Du; Jianfei Hua; Jiaru Shi; Chihao Pai; Wei Lu; Wenhui Huang; Huaibi Chen; Chuanxiang Tang

doi:10.1063/1.4981131

Diffraction based method to reconstruct the spectrum of the Thomson scattering x-ray source

Rev Sci Instrum. 2017 Apr;88(4):045110. doi: 10.1063/1.4981131.

Authors

Zhijun Chi¹, Lixin Yan¹, Zhen Zhang¹, Zheng Zhou¹, Lianmin Zheng¹, Dong Wang¹, Qili Tian¹, Wei Wang¹, Zan Nie¹, Jie Zhang¹, Yingchao Du¹, Jianfei Hua¹, Jiaru Shi¹, Chihao Pai¹, Wei Lu¹, Wenhui Huang¹, Huaibi Chen¹, Chuanxiang Tang¹

Affiliation

¹ Accelerator Laboratory, Department of Engineering Physics, Tsinghua University, Beijing 100084, China and Ministry of Education, Key Laboratory of Particle and Radiation Imaging, Tsinghua University, Beijing 100084, China.

PMID: 28456250
DOI: 10.1063/1.4981131

Abstract

As Thomson scattering x-ray sources based on the collision of intense laser and relativistic electrons have drawn much attention in various scientific fields, there is an increasing demand for the effective methods to reconstruct the spectrum information of the ultra-short and high-intensity x-ray pulses. In this paper, a precise spectrum measurement method for the Thomson scattering x-ray sources was proposed with the diffraction of a Highly Oriented Pyrolytic Graphite (HOPG) crystal and was demonstrated at the Tsinghua Thomson scattering X-ray source. The x-ray pulse is diffracted by a 15 mm (L) ×15 mm (H)× 1 mm (D) HOPG crystal with 1° mosaic spread. By analyzing the diffraction pattern, both x-ray peak energies and energy spectral bandwidths at different polar angles can be reconstructed, which agree well with the theoretical value and simulation. The higher integral reflectivity of the HOPG crystal makes this method possible for single-shot measurement.