X-ray free electron laser single-particle analysis for biological systems

Osamu Miyashita; Yasumasa Joti

doi:10.1016/j.sbi.2017.03.014

X-ray free electron laser single-particle analysis for biological systems

Curr Opin Struct Biol. 2017 Apr:43:163-169. doi: 10.1016/j.sbi.2017.03.014. Epub 2017 May 10.

Authors

Osamu Miyashita¹, Yasumasa Joti²

Affiliations

¹ Advanced Institute of Computational Science, RIKEN, 6-7-1, Minatojima-minami-machi, Chuo-ku, Kobe, Hyogo 650-0047, Japan. Electronic address: osamu.miyashita@riken.jp.
² XFEL Utilization Division, Japan Synchrotron Radiation Research Institute (JASRI), 1-1-1 Kouto, Sayo-cho, Sayo-gun, Hyogo 679-5198, Japan.

PMID: 28501339
DOI: 10.1016/j.sbi.2017.03.014

Abstract

The X-ray free electron laser (XFEL) is a new light source that can produce coherent, ultra-brilliant, femtosecond X-ray pulses. This X-ray beam provides new possibilities for studies in structural biology. In this review, we survey the applications of XFEL to biological systems, with an emphasis on studies of noncrystalline samples. Although atomic-level modeling is not yet achievable, this method enables high-throughput, damage-free imaging of biological samples under near-physiological conditions and is being rapidly developed. Here, we provide overviews of XFEL technology, experimental techniques, and computational data analyses, and discuss examples of such studies.

Publication types

Review
Research Support, Non-U.S. Gov't

MeSH terms

Electrons*
Equipment Design
Imaging, Three-Dimensional
Lasers*
Molecular Imaging / instrumentation
Molecular Imaging / methods*
X-Rays