Charge-separated spectra of suprathermal highly charged bismuth ions in a dual laser-produced plasma soft x-ray source

Hiromu Kawasaki; Toshiki Tamura; Atsushi Sunahara; Masaharu Nishikino; Shinichi Namba; Gerry O'Sullivan; Takeshi Higashiguchi

doi:10.1063/5.0012225

Charge-separated spectra of suprathermal highly charged bismuth ions in a dual laser-produced plasma soft x-ray source

Rev Sci Instrum. 2020 Aug 1;91(8):086103. doi: 10.1063/5.0012225.

Authors

Hiromu Kawasaki¹, Toshiki Tamura¹, Atsushi Sunahara², Masaharu Nishikino³, Shinichi Namba⁴, Gerry O'Sullivan⁵, Takeshi Higashiguchi¹

Affiliations

¹ Department of Electrical and Electronic Engineering, Faculty of Engineering, Utsunomiya University, 7-1-2 Yoto, Utsunomiya, Tochigi 321-8585, Japan.
² Center for Materials Under Extreme Environment (CMUXE), School of Nuclear Engineering, Purdue University, West Lafayette, Indiana 47907, USA.
³ Kansai Photon Science Institute, National Institutes for Quantum and Radiological Science and Technology (QST), Kizugawa, Kyoto 619-0215, Japan.
⁴ Graduate School of Engineering, Hiroshima University, 1-4-1 Kagamiyama, Higashihiroshima, Hiroshima 739-8527, Japan.
⁵ School of Physics, University College Dublin, Belfield, Dublin 4, Ireland.

PMID: 32872925
DOI: 10.1063/5.0012225

Abstract

We investigated the charge-separated spectra of highly charged suprathermal bismuth (Bi) ions from a dual laser-produced plasma soft x-ray source developed for soft x-ray microscopy. The charge distribution of these suprathermal ions emitted from a solid planar Bi target was measured by an electrostatic energy analyzer. The maximum ionic charge state was observed to be Z = 17 and to possess a maximum energy of about 200 keV. This evaluation provides important information essential for the development of debris mitigation schemes in a soft x-ray microscope.