A sample-position-autocorrection system with precision better than 1 µm in angle-resolved photoemission experiments

Shaofeng Duan; Shichong Wang; Yuanyuan Yang; Chaozhi Huang; Lingxiao Gu; Haoran Liu; Wentao Zhang

doi:10.1063/5.0106299

A sample-position-autocorrection system with precision better than 1 µm in angle-resolved photoemission experiments

Rev Sci Instrum. 2022 Oct 1;93(10):103905. doi: 10.1063/5.0106299.

Authors

Shaofeng Duan¹, Shichong Wang¹, Yuanyuan Yang¹, Chaozhi Huang¹, Lingxiao Gu¹, Haoran Liu¹, Wentao Zhang¹

Affiliation

¹ Key Laboratory of Artificial Structures and Quantum Control (Ministry of Education), Shenyang National Laboratory for Materials Science, School of Physics and Astronomy, Shanghai Jiao Tong University, Shanghai 200240, China.

PMID: 36319388
DOI: 10.1063/5.0106299

Abstract

We present the development of a high-precision sample-position-autocorrection system for photoemission experiments. A binocular vision method based on image pattern matching calculations was realized to track the sample position with an accuracy better than 1 µm, which was much smaller than the spot size of the incident laser. We illustrate the performance of the sample-position-autocorrection system with representative photoemission data on the topological insulator Bi₂Se₃ and an optimally doped cuprate superconductor Bi₂Sr₂CaCu₂O_8+δ. Our method provides new possibilities for studying the temperature-dependent electronic structures in quantum materials using laser-based or spatially resolved photoemission systems with high precision and efficiency.