X-ray beam diagnostics at the MID instrument of the European X-ray Free-Electron Laser Facility

J Synchrotron Radiat. 2024 May 1;31(Pt 3):596-604. doi: 10.1107/S1600577524001279. Epub 2024 Apr 8.

Abstract

The Materials Imaging and Dynamics (MID) instrument at the European X-ray Free-Electron Laser Facility (EuXFEL) is equipped with a multipurpose diagnostic end-station (DES) at the end of the instrument. The imager unit in DES is a key tool for aligning the beam to a standard trajectory and for adjusting optical elements such as focusing lenses or the split-and-delay line. Furthermore, the DES features a bent-diamond-crystal spectrometer to disperse the spectrum of the direct beam to a line detector. This enables pulse-resolved characterization of the EuXFEL spectrum to provide X-ray energy calibration, and the spectrometer is particularly useful in commissioning special modes of the accelerator. Together with diamond-based intensity monitors, the imager and spectrometer form the DES unit which also contains a heavy-duty beamstop at the end of the MID instrument. Here, we describe the setup in detail and provide exemplary beam diagnostic results.

Keywords: Materials Imaging and Dynamics instrument; X-ray free-electron lasers; beam diagnostics; bent-diamond-crystal spectrometer; multipurpose diagnostic end-station.