Angle-resolved Auger study of 10-keV Ar+-ion-induced Si LMM atomic lines
Phys Rev B Condens Matter
.
1990 Jun 15;41(18):12590-12598.
doi: 10.1103/physrevb.41.12590.
Authors
A Bonanno
,
F Xu
,
M Camarca
,
R Siciliano
,
A Oliva
PMID:
9993733
DOI:
10.1103/physrevb.41.12590
No abstract available