Computer-controlled spot-scan imaging of crotoxin complex crystals with 400 keV electrons at near-atomic resolution.
Brink J, Chiu W, Dougherty M.
Brink J, et al. Among authors: chiu w.
Ultramicroscopy. 1992 Oct;46(1-4):229-40. doi: 10.1016/0304-3991(92)90017-e.
Ultramicroscopy. 1992.
PMID: 1481273
400 keV electrons yield a better relative image contrast than 100 keV electrons for a beam-sensitive organic crystal when spot-scan imaging is used [J. Brink and W. Chiu, J. Microscopy 161 (1991) 279]. A FORTRAN 77 program has been written to operate the spot-scan i …
400 keV electrons yield a better relative image contrast than 100 keV electrons for a beam-sensitive organic crystal when spot-scan imaging …