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Shearing interferometer for quantifying the coherence of hard x-ray beams.
Pfeiffer F, Bunk O, Schulze-Briese C, Diaz A, Weitkamp T, David C, van der Veen JF, Vartanyants I, Robinson IK. Pfeiffer F, et al. Among authors: van der veen jf. Phys Rev Lett. 2005 Apr 29;94(16):164801. doi: 10.1103/PhysRevLett.94.164801. Epub 2005 Apr 26. Phys Rev Lett. 2005. PMID: 15904233 Free article.
Confinement-induced liquid ordering investigated by x-ray phase retrieval.
Bunk O, Diaz A, Pfeiffer F, David C, Padeste C, Keymeulen H, Willmott PR, Patterson BD, Schmitt B, Satapathy DK, van der Veen JF, Guo H, Wegdam GH. Bunk O, et al. Among authors: van der veen jf. Phys Rev E Stat Nonlin Soft Matter Phys. 2007 Feb;75(2 Pt 1):021501. doi: 10.1103/PhysRevE.75.021501. Epub 2007 Feb 6. Phys Rev E Stat Nonlin Soft Matter Phys. 2007. PMID: 17358342
Focusing x-ray beams to nanometer dimensions.
Bergemann C, Keymeulen H, van der Veen JF. Bergemann C, et al. Among authors: van der veen jf. Phys Rev Lett. 2003 Nov 14;91(20):204801. doi: 10.1103/PhysRevLett.91.204801. Epub 2003 Nov 10. Phys Rev Lett. 2003. PMID: 14683366
33 results