Electronic origin of the enhanced thermoelectric efficiency of Cu2Se.
Sun S, Li Y, Chen Y, Xu X, Kang L, Zhou J, Xia W, Liu S, Wang M, Jiang J, Liang A, Pei D, Zhao K, Qiu P, Shi X, Chen L, Guo Y, Wang Z, Zhang Y, Liu Z, Yang L, Chen Y.
Sun S, et al.
Sci Bull (Beijing). 2020 Nov 30;65(22):1888-1893. doi: 10.1016/j.scib.2020.07.007. Epub 2020 Jul 7.
Sci Bull (Beijing). 2020.
PMID: 36738053