Sebastian A - Search Results

1

Ultralow nanoscale wear through atom-by-atom attrition in silicon-containing diamond-like carbon.

Bhaskaran H, Gotsmann B, Sebastian A, Drechsler U, Lantz MA, Despont M, Jaroenapibal P, Carpick RW, Chen Y, Sridharan K. Bhaskaran H, et al. Among authors: sebastian a. Nat Nanotechnol. 2010 Mar;5(3):181-5. doi: 10.1038/nnano.2010.3. Epub 2010 Jan 31. Nat Nanotechnol. 2010. PMID: 20118919

2

Encapsulated tips for reliable nanoscale conduction in scanning probe technologies.

Bhaskaran H, Sebastian A, Drechsler U, Despont M. Bhaskaran H, et al. Among authors: sebastian a. Nanotechnology. 2009 Mar 11;20(10):105701. doi: 10.1088/0957-4484/20/10/105701. Epub 2009 Feb 17. Nanotechnology. 2009. PMID: 19417529

3

Nanoscale phase transformation in Ge2Sb2Te5 using encapsulated scanning probes and retraction force microscopy.

Bhaskaran H, Sebastian A, Pauza A, Pozidis H, Despont M. Bhaskaran H, et al. Among authors: sebastian a. Rev Sci Instrum. 2009 Aug;80(8):083701. doi: 10.1063/1.3204449. Rev Sci Instrum. 2009. PMID: 19725656

4

High-throughput intermittent-contact scanning probe microscopy.

Sahoo DR, Häberle W, Sebastian A, Pozidis H, Eleftheriou E. Sahoo DR, et al. Among authors: sebastian a. Nanotechnology. 2010 Feb 19;21(7):75701. doi: 10.1088/0957-4484/21/7/075701. Epub 2010 Jan 18. Nanotechnology. 2010. PMID: 20081288

5

Impulsive control for fast nanopositioning.

Tuma T, Sebastian A, Häberle W, Lygeros J, Pantazi A. Tuma T, et al. Among authors: sebastian a. Nanotechnology. 2011 Apr 1;22(13):135501. doi: 10.1088/0957-4484/22/13/135501. Epub 2011 Feb 22. Nanotechnology. 2011. PMID: 21343639

6

Scanning probe microscopy based on magnetoresistive sensing.

Sahoo DR, Sebastian A, Häberle W, Pozidis H, Eleftheriou E. Sahoo DR, et al. Among authors: sebastian a. Nanotechnology. 2011 Apr 8;22(14):145501. doi: 10.1088/0957-4484/22/14/145501. Epub 2011 Feb 24. Nanotechnology. 2011. PMID: 21346303

7

Force modulation for enhanced nanoscale electrical sensing.

Koelmans WW, Sebastian A, Abelmann L, Despont M, Pozidis H. Koelmans WW, et al. Among authors: sebastian a. Nanotechnology. 2011 Sep 2;22(35):355706. doi: 10.1088/0957-4484/22/35/355706. Epub 2011 Aug 8. Nanotechnology. 2011. PMID: 21821873

8

High-speed multiresolution scanning probe microscopy based on Lissajous scan trajectories.

Tuma T, Lygeros J, Kartik V, Sebastian A, Pantazi A. Tuma T, et al. Among authors: sebastian a. Nanotechnology. 2012 May 11;23(18):185501. doi: 10.1088/0957-4484/23/18/185501. Epub 2012 Apr 20. Nanotechnology. 2012. PMID: 22516658

9

Note: micro-cantilevers with AlN actuators and PtSi tips for multi-frequency atomic force microscopy.

Sebastian A, Shamsudhin N, Rothuizen H, Drechsler U, Koelmans WW, Bhaskaran H, Quenzer HJ, Wagner B, Despont M. Sebastian A, et al. Rev Sci Instrum. 2012 Sep;83(9):096107. doi: 10.1063/1.4755749. Rev Sci Instrum. 2012. PMID: 23020434

10

A high-bandwidth spintronic position sensor.

Tuma T, Pantazi A, Sahoo DR, Eib P, Salis G, Pozidis H, Sebastian A. Tuma T, et al. Among authors: sebastian a. Nanotechnology. 2014 Sep 19;25(37):375501. doi: 10.1088/0957-4484/25/37/375501. Epub 2014 Aug 22. Nanotechnology. 2014. PMID: 25148257

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