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Page 1
Single shot damage mechanism of Mo/Si multilayer optics under intense pulsed XUV-exposure.
Khorsand AR, Sobierajski R, Louis E, Bruijn S, van Hattum ED, van de Kruijs RW, Jurek M, Klinger D, Pelka JB, Juha L, Burian T, Chalupsky J, Cihelka J, Hajkova V, Vysin L, Jastrow U, Stojanovic N, Toleikis S, Wabnitz H, Tiedtke K, Sokolowski-Tinten K, Shymanovich U, Krzywinski J, Hau-Riege S, London R, Gleeson A, Gullikson EM, Bijkerk F. Khorsand AR, et al. Among authors: pelka jb. Opt Express. 2010 Jan 18;18(2):700-12. doi: 10.1364/OE.18.000700. Opt Express. 2010. PMID: 20173890 Free article.
Non-thermal desorption/ablation of molecular solids induced by ultra-short soft x-ray pulses.
Chalupský J, Juha L, Hájková V, Cihelka J, Vysín L, Gautier J, Hajdu J, Hau-Riege SP, Jurek M, Krzywinski J, London RA, Papalazarou E, Pelka JB, Rey G, Sebban S, Sobierajski R, Stojanovic N, Tiedtke K, Toleikis S, Tschentscher T, Valentin C, Wabnitz H, Zeitoun P. Chalupský J, et al. Among authors: pelka jb. Opt Express. 2009 Jan 5;17(1):208-17. doi: 10.1364/oe.17.000208. Opt Express. 2009. PMID: 19129890 Free article.
Damage mechanisms of MoN/SiN multilayer optics for next-generation pulsed XUV light sources.
Sobierajski R, Bruijn S, Khorsand AR, Louis E, van de Kruijs RW, Burian T, Chalupsky J, Cihelka J, Gleeson A, Grzonka J, Gullikson EM, Hajkova V, Hau-Riege S, Juha L, Jurek M, Klinger D, Krzywinski J, London R, Pelka JB, Płociński T, Rasiński M, Tiedtke K, Toleikis S, Vysin L, Wabnitz H, Bijkerk F. Sobierajski R, et al. Among authors: pelka jb. Opt Express. 2011 Jan 3;19(1):193-205. doi: 10.1364/OE.19.000193. Opt Express. 2011. PMID: 21263557 Free article.
Role of heat accumulation in the multi-shot damage of silicon irradiated with femtosecond XUV pulses at a 1 MHz repetition rate.
Sobierajski R, Jacyna I, Dłużewski P, Klepka MT, Klinger D, Pełka JB, Burian T, Hájková V, Juha L, Saksl K, Vozda V, Makhotkin I, Louis E, Faatz B, Tiedtke K, Toleikis S, Enkisch H, Hermann M, Strobel S, Loch RA, Chalupsky J. Sobierajski R, et al. Among authors: pelka jb. Opt Express. 2016 Jul 11;24(14):15468-77. doi: 10.1364/OE.24.015468. Opt Express. 2016. PMID: 27410821 Free article.
Soft x-ray free electron laser microfocus for exploring matter under extreme conditions.
Nelson AJ, Toleikis S, Chapman H, Bajt S, Krzywinski J, Chalupsky J, Juha L, Cihelka J, Hajkova V, Vysin L, Burian T, Kozlova M, Fäustlin RR, Nagler B, Vinko SM, Whitcher T, Dzelzainis T, Renner O, Saksl K, Khorsand AR, Heimann PA, Sobierajski R, Klinger D, Jurek M, Pelka J, Iwan B, Andreasson J, Timneanu N, Fajardo M, Wark JS, Riley D, Tschentscher T, Hajdu J, Lee RW. Nelson AJ, et al. Opt Express. 2009 Sep 28;17(20):18271-8. doi: 10.1364/OE.17.018271. Opt Express. 2009. PMID: 19907618 Free article.
Characteristics of focused soft X-ray free-electron laser beam determined by ablation of organic molecular solids.
Chalupský J, Juha L, Kuba J, Cihelka J, Hájková V, Koptyaev S, Krása J, Velyhan A, Bergh M, Caleman C, Hajdu J, Bionta RM, Chapman H, Hau-Riege SP, London RA, Jurek M, Krzywinski J, Nietubyc R, Pelka JB, Sobierajski R, Meyer-Ter-Vehn J, Tronnier A, Sokolowski-Tinten K, Stojanovic N, Tiedtke K, Toleikis S, Tschentscher T, Wabnitz H, Zastrau U. Chalupský J, et al. Among authors: pelka jb. Opt Express. 2007 May 14;15(10):6036-43. doi: 10.1364/oe.15.006036. Opt Express. 2007. PMID: 19546907 Free article.