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Page 1
Single shot damage mechanism of Mo/Si multilayer optics under intense pulsed XUV-exposure.
Khorsand AR, Sobierajski R, Louis E, Bruijn S, van Hattum ED, van de Kruijs RW, Jurek M, Klinger D, Pelka JB, Juha L, Burian T, Chalupsky J, Cihelka J, Hajkova V, Vysin L, Jastrow U, Stojanovic N, Toleikis S, Wabnitz H, Tiedtke K, Sokolowski-Tinten K, Shymanovich U, Krzywinski J, Hau-Riege S, London R, Gleeson A, Gullikson EM, Bijkerk F. Khorsand AR, et al. Among authors: van de kruijs rw, van hattum ed. Opt Express. 2010 Jan 18;18(2):700-12. doi: 10.1364/OE.18.000700. Opt Express. 2010. PMID: 20173890 Free article.
Damage mechanisms of MoN/SiN multilayer optics for next-generation pulsed XUV light sources.
Sobierajski R, Bruijn S, Khorsand AR, Louis E, van de Kruijs RW, Burian T, Chalupsky J, Cihelka J, Gleeson A, Grzonka J, Gullikson EM, Hajkova V, Hau-Riege S, Juha L, Jurek M, Klinger D, Krzywinski J, London R, Pelka JB, Płociński T, Rasiński M, Tiedtke K, Toleikis S, Vysin L, Wabnitz H, Bijkerk F. Sobierajski R, et al. Among authors: van de kruijs rw. Opt Express. 2011 Jan 3;19(1):193-205. doi: 10.1364/OE.19.000193. Opt Express. 2011. PMID: 21263557 Free article.
Mechanism of single-shot damage of Ru thin films irradiated by femtosecond extreme UV free-electron laser.
Milov I, Makhotkin IA, Sobierajski R, Medvedev N, Lipp V, Chalupský J, Sturm JM, Tiedtke K, de Vries G, Störmer M, Siewert F, van de Kruijs R, Louis E, Jacyna I, Jurek M, Juha L, Hájková V, Vozda V, Burian T, Saksl K, Faatz B, Keitel B, Plönjes E, Schreiber S, Toleikis S, Loch R, Hermann M, Strobel S, Nienhuys HK, Gwalt G, Mey T, Enkisch H, Bijkerk F. Milov I, et al. Opt Express. 2018 Jul 23;26(15):19665-19685. doi: 10.1364/OE.26.019665. Opt Express. 2018. PMID: 30114137 Free article.
Mo/Si multilayer-coated amplitude-division beam splitters for XUV radiation sources.
Sobierajski R, Loch RA, van de Kruijs RW, Louis E, von Blanckenhagen G, Gullikson EM, Siewert F, Wawro A, Bijkerk F. Sobierajski R, et al. Among authors: van de kruijs rw. J Synchrotron Radiat. 2013 Mar;20(Pt 2):249-57. doi: 10.1107/S0909049512049990. Epub 2013 Jan 23. J Synchrotron Radiat. 2013. PMID: 23412481 Free PMC article.
Phase characterization of the reflection on an extreme UV multilayer: comparison between attosecond metrology and standing wave measurements.
Loch RA, Dubrouil A, Sobierajski R, Descamps D, Fabre B, Lidon P, van de Kruijs RW, Boekhout F, Gullikson E, Gaudin J, Louis E, Bijkerk F, Mével E, Petit S, Constant E, Mairesse Y. Loch RA, et al. Among authors: van de kruijs rw. Opt Lett. 2011 Sep 1;36(17):3386-8. doi: 10.1364/OL.36.003386. Opt Lett. 2011. PMID: 21886219
Experimental study of EUV mirror radiation damage resistance under long-term free-electron laser exposures below the single-shot damage threshold.
Makhotkin IA, Sobierajski R, Chalupský J, Tiedtke K, de Vries G, Störmer M, Scholze F, Siewert F, van de Kruijs RWE, Milov I, Louis E, Jacyna I, Jurek M, Klinger D, Nittler L, Syryanyy Y, Juha L, Hájková V, Vozda V, Burian T, Saksl K, Faatz B, Keitel B, Plönjes E, Schreiber S, Toleikis S, Loch R, Hermann M, Strobel S, Nienhuys HK, Gwalt G, Mey T, Enkisch H. Makhotkin IA, et al. J Synchrotron Radiat. 2018 Jan 1;25(Pt 1):77-84. doi: 10.1107/S1600577517017362. Epub 2018 Jan 1. J Synchrotron Radiat. 2018. PMID: 29271755 Free PMC article.
Infrared suppression by hybrid EUV multilayer--IR etalon structures.
Medvedev VV, Yakshin AE, van de Kruijs RW, Krivtsun VM, Yakunin AM, Koshelev KN, Bijkerk F. Medvedev VV, et al. Among authors: van de kruijs rw. Opt Lett. 2011 Sep 1;36(17):3344-6. doi: 10.1364/OL.36.003344. Opt Lett. 2011. PMID: 21886205
27 results