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The effect of germanium on the Co-SiGe thin-film reaction.
Boyanov BI, Goeller PT, Sayers DE, Nemanich RJ. Boyanov BI, et al. J Synchrotron Radiat. 1999 May 1;6(Pt 3):521-3. doi: 10.1107/S0909049599000060. Epub 1999 May 1. J Synchrotron Radiat. 1999. PMID: 15263366 No abstract available.
Estimation of uncertainties in XAFS data.
Newville M, Boyanov BI, Sayers DE. Newville M, et al. Among authors: boyanov bi. J Synchrotron Radiat. 1999 May 1;6(Pt 3):264-5. doi: 10.1107/S0909049598018147. Epub 1999 May 1. J Synchrotron Radiat. 1999. PMID: 15263272 No abstract available.
Cobalt silicide formation on 6H silicon carbide.
Porto AO, Boyanov BI, Sayers DE, Nemanich RJ. Porto AO, et al. Among authors: boyanov bi. J Synchrotron Radiat. 1999 May 1;6(Pt 3):188-9. doi: 10.1107/S0909049599001326. Epub 1999 May 1. J Synchrotron Radiat. 1999. PMID: 15263243 No abstract available.
Analysis of EXAFS Data from Mixed-Shell Systems.
Boyanov BI, Bunker G, Morrison TI. Boyanov BI, et al. J Synchrotron Radiat. 1996 May 1;3(Pt 3):120-8. doi: 10.1107/S0909049596003585. J Synchrotron Radiat. 1996. PMID: 16702669
23 results