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Characterization of silicon heterojunctions for solar cells.
Nanoscale Res Lett. 2011 Feb 16;6(1):152. doi: 10.1186/1556-276X-6-152.
Nanoscale Res Lett. 2011.
PMID: 21711658
Free PMC article.
Conductive-probe atomic force microscopy characterization of silicon nanowire.
Alvarez J, Ngo I, Gueunier-Farret ME, Kleider JP, Yu L, Cabarrocas PR, Perraud S, Rouvière E, Celle C, Mouchet C, Simonato JP.
Alvarez J, et al. Among authors: gueunier farret me.
Nanoscale Res Lett. 2011 Jan 31;6(1):110. doi: 10.1186/1556-276X-6-110.
Nanoscale Res Lett. 2011.
PMID: 21711623
Free PMC article.
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