Rosenwaks Y - Search Results

1

Built-in potential and charge distribution within single heterostructured nanorods measured by scanning Kelvin probe microscopy.

Nanayakkara SU, Cohen G, Jiang CS, Romero MJ, Maturova K, Al-Jassim M, van de Lagemaat J, Rosenwaks Y, Luther JM. Nanayakkara SU, et al. Among authors: rosenwaks y. Nano Lett. 2013 Mar 13;13(3):1278-84. doi: 10.1021/nl4000147. Epub 2013 Feb 8. Nano Lett. 2013. PMID: 23379602

2

Reconstruction of surface potential from Kelvin probe force microscopy images.

Cohen G, Halpern E, Nanayakkara SU, Luther JM, Held C, Bennewitz R, Boag A, Rosenwaks Y. Cohen G, et al. Among authors: rosenwaks y. Nanotechnology. 2013 Jul 26;24(29):295702. doi: 10.1088/0957-4484/24/29/295702. Epub 2013 Jun 27. Nanotechnology. 2013. PMID: 23807266

3

Barrier height measurement of metal contacts to Si nanowires using internal photoemission of hot carriers.

Yoon K, Hyun JK, Connell JG, Amit I, Rosenwaks Y, Lauhon LJ. Yoon K, et al. Among authors: rosenwaks y. Nano Lett. 2013;13(12):6183-8. doi: 10.1021/nl4035412. Epub 2013 Nov 18. Nano Lett. 2013. PMID: 24224834

4

Density and energy distribution of interface states in the grain boundaries of polysilicon nanowire.

Amit I, Englander D, Horvitz D, Sasson Y, Rosenwaks Y. Amit I, et al. Among authors: rosenwaks y. Nano Lett. 2014 Nov 12;14(11):6190-4. doi: 10.1021/nl5024468. Epub 2014 Oct 13. Nano Lett. 2014. PMID: 25299928

5

Measurement of active dopant distribution and diffusion in individual silicon nanowires.

Koren E, Berkovitch N, Rosenwaks Y. Koren E, et al. Among authors: rosenwaks y. Nano Lett. 2010 Apr 14;10(4):1163-7. doi: 10.1021/nl9033158. Nano Lett. 2010. PMID: 20196550

6

Direct measurement of individual deep traps in single silicon nanowires.

Koren E, Elias G, Boag A, Hemesath ER, Lauhon LJ, Rosenwaks Y. Koren E, et al. Among authors: rosenwaks y. Nano Lett. 2011 Jun 8;11(6):2499-502. doi: 10.1021/nl201019b. Epub 2011 May 17. Nano Lett. 2011. PMID: 21591656

7

Room temperature observation of quantum confinement in single InAs nanowires.

Halpern E, Henning A, Shtrikman H, Rurali R, Cartoixà X, Rosenwaks Y. Halpern E, et al. Among authors: rosenwaks y. Nano Lett. 2015 Jan 14;15(1):481-5. doi: 10.1021/nl503809c. Epub 2014 Dec 15. Nano Lett. 2015. PMID: 25494683

8

Obtaining uniform dopant distributions in VLS-grown Si nanowires.

Koren E, Hyun JK, Givan U, Hemesath ER, Lauhon LJ, Rosenwaks Y. Koren E, et al. Among authors: rosenwaks y. Nano Lett. 2011 Jan 12;11(1):183-7. doi: 10.1021/nl103363c. Epub 2010 Dec 3. Nano Lett. 2011. PMID: 21126102

9

Spatially resolved correlation of active and total doping concentrations in VLS grown nanowires.

Amit I, Givan U, Connell JG, Paul DF, Hammond JS, Lauhon LJ, Rosenwaks Y. Amit I, et al. Among authors: rosenwaks y. Nano Lett. 2013 Jun 12;13(6):2598-604. doi: 10.1021/nl4007062. Nano Lett. 2013. PMID: 23668801

10

The role of the cantilever in Kelvin probe force microscopy measurements.

Elias G, Glatzel T, Meyer E, Schwarzman A, Boag A, Rosenwaks Y. Elias G, et al. Among authors: rosenwaks y. Beilstein J Nanotechnol. 2011;2:252-60. doi: 10.3762/bjnano.2.29. Epub 2011 May 18. Beilstein J Nanotechnol. 2011. PMID: 21977437 Free PMC article.

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