Beamlet scraping and its influence on the beam divergence at the BATMAN Upgrade test facility.
Wimmer C, Bonomo F, Hurlbatt A, Schiesko L, Fantz U, Harder ND, Heinemann B, Mimo A, Orozco G, Agostini M, Barbisan M, Brombin M, Delogu R, Pimazzoni A, Poggi C, Serianni G, Ugoletti M, Veltri P.
Wimmer C, et al. Among authors: bonomo f.
Rev Sci Instrum. 2020 Jan 1;91(1):013509. doi: 10.1063/1.5129336.
Rev Sci Instrum. 2020.
PMID: 32012577