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Stability of silver nanowire based electrodes under environmental and electrical stresses.
Nanoscale. 2015 Feb 7;7(5):2107-15. doi: 10.1039/c4nr06783e.
Nanoscale. 2015.
PMID: 25559872
3D high resolution imaging for microelectronics: A multi-technique survey on copper pillars.
Fraczkiewicz A, Lorut F, Audoit G, Boller E, Capria E, Cloetens P, Da Silva J, Farcy A, Mourier T, Ponthenier F, Bleuet P.
Fraczkiewicz A, et al.
Ultramicroscopy. 2018 Oct;193:71-83. doi: 10.1016/j.ultramic.2018.04.012. Epub 2018 Jun 15.
Ultramicroscopy. 2018.
PMID: 29957329
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Is plastic flow always controlled by dislocation mobility? An answer from in situ transmission electron microscopy straining tests.
Louchet F, Doisneau-Cottignies B, Calonne O, Fraczkiewicz A, Janecek M, Guelton N.
Louchet F, et al. Among authors: fraczkiewicz a.
J Microsc. 2001 Jul;203(Pt 1):84-9. doi: 10.1046/j.1365-2818.2001.00915.x.
J Microsc. 2001.
PMID: 11454158
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Three-dimensional atomic-scale imaging of impurity segregation to line defects.
Blavette D, Cadel E, Fraczkiewicz A, Menand A.
Blavette D, et al. Among authors: fraczkiewicz a.
Science. 1999 Dec 17;286(5448):2317-9. doi: 10.1126/science.286.5448.2317.
Science. 1999.
PMID: 10600736
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