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Publisher's Note: "Evaluation of a flat-field grazing incidence spectrometer for highly charged ion plasma emission in soft x-ray spectral region from 1 to 10 nm" [Rev. Sci. Instrum. 87, 123106 (2016)].
Dinh TH, Kondo Y, Tamura T, Ono Y, Hara H, Oikawa H, Yamamoto Y, Ishino M, Nishikino M, Makimura T, Dunne P, O'Sullivan G, Ohta S, Kitano K, Ejima T, Hatano T, Higashiguchi T. Dinh TH, et al. Among authors: hatano t. Rev Sci Instrum. 2017 Feb;88(2):029902. doi: 10.1063/1.4973926. Rev Sci Instrum. 2017. PMID: 28249516 No abstract available.
Evaluation of a flat-field grazing incidence spectrometer for highly charged ion plasma emission in soft x-ray spectral region from 1 to 10 nm.
Dinh TH, Kondo Y, Tamura T, Ono Y, Hara H, Oikawa H, Yamamoto Y, Ishino M, Nishikino M, Makimura T, Dunne P, O'Sullivan G, Ohta S, Kitano K, Ejima T, Hatano T, Higashiguchi T. Dinh TH, et al. Among authors: hatano t. Rev Sci Instrum. 2016 Dec;87(12):123106. doi: 10.1063/1.4971421. Rev Sci Instrum. 2016. PMID: 28040919
Soft x-ray laser beamline for surface processing and damage studies.
Ishino M, Dinh TH, Hosaka Y, Hasegawa N, Yoshimura K, Yamamoto H, Hatano T, Higashiguchi T, Sakaue K, Ichimaru S, Hatayama M, Sasaki A, Washio M, Nishikino M, Maekawa Y. Ishino M, et al. Among authors: hatano t. Appl Opt. 2020 Apr 20;59(12):3692-3698. doi: 10.1364/AO.387792. Appl Opt. 2020. PMID: 32400492
924 results