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Preservation of Surface Conductivity and Dielectric Loss Tangent in Large-Scale, Encapsulated Epitaxial Graphene Measured by Noncontact Microwave Cavity Perturbations.
Rigosi AF, Glavin NR, Liu CI, Yang Y, Obrzut J, Hill HM, Hu J, Lee HY, Hight Walker AR, Richter CA, Elmquist RE, Newell DB. Rigosi AF, et al. Among authors: hu j. Small. 2017 Jul;13(26):10.1002/smll.201700452. doi: 10.1002/smll.201700452. Epub 2017 May 19. Small. 2017. PMID: 28544485 Free PMC article.
Measuring the dielectric and optical response of millimeter-scale amorphous and hexagonal boron nitride films grown on epitaxial graphene.
Rigosi AF, Hill HM, Glavin NR, Pookpanratana SJ, Yang Y, Boosalis AG, Hu J, Rice A, Allerman AA, Nguyen NV, Hacker CA, Elmquist RE, Hight Walker AR, Newell DB. Rigosi AF, et al. Among authors: hu j. 2d Mater. 2018 Jan;5(1):011011. doi: 10.1088/2053-1583/aa9ea3. Epub 2017 Dec 13. 2d Mater. 2018. PMID: 29545949 Free PMC article.
Quantum Hall device data monitoring following encapsulating polymer deposition.
Rigosi AF, Liu CI, Wu BY, Lee HY, Kruskopf M, Yang Y, Hill HM, Hu J, Bittle EG, Obrzut J, Hight Walker AR, Elmquist RE, Newell DB. Rigosi AF, et al. Among authors: hu j. Data Brief. 2018 Aug 30;20:1201-1208. doi: 10.1016/j.dib.2018.08.121. eCollection 2018 Oct. Data Brief. 2018. PMID: 30238028 Free PMC article.
Confocal laser scanning microscopy for rapid optical characterization of graphene.
Panchal V, Yang Y, Cheng G, Hu J, Kruskopf M, Liu CI, Rigosi AF, Melios C, Hight Walker AR, Newell DB, Kazakova O, Elmquist RE. Panchal V, et al. Among authors: hu j. Commun Phys. 2018;1:10.1038/s42005-018-0084-6. doi: 10.1038/s42005-018-0084-6. Commun Phys. 2018. PMID: 31093580 Free PMC article.
Graphene Devices for Tabletop and High-Current Quantized Hall Resistance Standards.
Rigosi AF, Panna AR, Payagala SU, Kruskopf M, Kraft ME, Jones GR, Wu BY, Lee HY, Yang Y, Hu J, Jarrett DG, Newell DB, Elmquist RE. Rigosi AF, et al. Among authors: hu j. IEEE Trans Instrum Meas. 2018;68:10.1109/TIM.2018.2882958. doi: 10.1109/TIM.2018.2882958. IEEE Trans Instrum Meas. 2018. PMID: 31274879 Free PMC article.
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