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Model-free classification of X-ray scattering signals applied to image segmentation.
Lutz-Bueno V, Arboleda C, Leu L, Blunt MJ, Busch A, Georgiadis A, Bertier P, Schmatz J, Varga Z, Villanueva-Perez P, Wang Z, Lebugle M, David C, Stampanoni M, Diaz A, Guizar-Sicairos M, Menzel A. Lutz-Bueno V, et al. Among authors: david c. J Appl Crystallogr. 2018 Sep 10;51(Pt 5):1378-1386. doi: 10.1107/S1600576718011032. eCollection 2018 Oct 1. J Appl Crystallogr. 2018. PMID: 30279640 Free PMC article.
Angular spectrum simulation of X-ray focusing by Fresnel zone plates.
Vila-Comamala J, Wojcik M, Diaz A, Guizar-Sicairos M, Kewish CM, Wang S, David C. Vila-Comamala J, et al. Among authors: david c. J Synchrotron Radiat. 2013 May;20(Pt 3):397-404. doi: 10.1107/S090904951300263X. Epub 2013 Mar 12. J Synchrotron Radiat. 2013. PMID: 23592617 Free PMC article.
Sensitivity of X-ray grating interferometry.
Modregger P, Pinzer BR, Thüring T, Rutishauser S, David C, Stampanoni M. Modregger P, et al. Among authors: david c. Opt Express. 2011 Sep 12;19(19):18324-38. doi: 10.1364/OE.19.018324. Opt Express. 2011. PMID: 21935201 Free article.
High-resolution scanning x-ray diffraction microscopy.
Thibault P, Dierolf M, Menzel A, Bunk O, David C, Pfeiffer F. Thibault P, et al. Among authors: david c. Science. 2008 Jul 18;321(5887):379-82. doi: 10.1126/science.1158573. Science. 2008. PMID: 18635796
2,231 results