Meyer JC - Search Results

1

Scanning transmission electron microscopy under controlled low-pressure atmospheres.

Leuthner GT, Hummel S, Mangler C, Pennycook TJ, Susi T, Meyer JC, Kotakoski J. Leuthner GT, et al. Among authors: meyer jc. Ultramicroscopy. 2019 Aug;203:76-81. doi: 10.1016/j.ultramic.2019.02.002. Epub 2019 Feb 4. Ultramicroscopy. 2019. PMID: 30739713

2

From point defects in graphene to two-dimensional amorphous carbon.

Kotakoski J, Krasheninnikov AV, Kaiser U, Meyer JC. Kotakoski J, et al. Among authors: meyer jc. Phys Rev Lett. 2011 Mar 11;106(10):105505. doi: 10.1103/PhysRevLett.106.105505. Epub 2011 Mar 9. Phys Rev Lett. 2011. PMID: 21469806

3

Transmission electron microscopy at 20 kV for imaging and spectroscopy.

Kaiser U, Biskupek J, Meyer JC, Leschner J, Lechner L, Rose H, Stöger-Pollach M, Khlobystov AN, Hartel P, Müller H, Haider M, Eyhusen S, Benner G. Kaiser U, et al. Among authors: meyer jc. Ultramicroscopy. 2011 Jul;111(8):1239-46. doi: 10.1016/j.ultramic.2011.03.012. Epub 2011 Apr 1. Ultramicroscopy. 2011. PMID: 21801697

4

Direct imaging of a two-dimensional silica glass on graphene.

Huang PY, Kurasch S, Srivastava A, Skakalova V, Kotakoski J, Krasheninnikov AV, Hovden R, Mao Q, Meyer JC, Smet J, Muller DA, Kaiser U. Huang PY, et al. Among authors: meyer jc. Nano Lett. 2012 Feb 8;12(2):1081-6. doi: 10.1021/nl204423x. Epub 2012 Jan 26. Nano Lett. 2012. PMID: 22268818

5

Accurate measurement of electron beam induced displacement cross sections for single-layer graphene.

Meyer JC, Eder F, Kurasch S, Skakalova V, Kotakoski J, Park HJ, Roth S, Chuvilin A, Eyhusen S, Benner G, Krasheninnikov AV, Kaiser U. Meyer JC, et al. Phys Rev Lett. 2012 May 11;108(19):196102. doi: 10.1103/PhysRevLett.108.196102. Epub 2012 May 7. Phys Rev Lett. 2012. PMID: 23003063

6

Atomistic description of electron beam damage in nitrogen-doped graphene and single-walled carbon nanotubes.

Susi T, Kotakoski J, Arenal R, Kurasch S, Jiang H, Skakalova V, Stephan O, Krasheninnikov AV, Kauppinen EI, Kaiser U, Meyer JC. Susi T, et al. Among authors: meyer jc. ACS Nano. 2012 Oct 23;6(10):8837-46. doi: 10.1021/nn303944f. Epub 2012 Oct 2. ACS Nano. 2012. PMID: 23009666

7

Probing from both sides: reshaping the graphene landscape via face-to-face dual-probe microscopy.

Eder FR, Kotakoski J, Holzweber K, Mangler C, Skakalova V, Meyer JC. Eder FR, et al. Among authors: meyer jc. Nano Lett. 2013 May 8;13(5):1934-40. doi: 10.1021/nl3042799. Epub 2013 Apr 4. Nano Lett. 2013. PMID: 23547751 Free PMC article.

8

Atomic structure from large-area, low-dose exposures of materials: a new route to circumvent radiation damage.

Meyer JC, Kotakoski J, Mangler C. Meyer JC, et al. Ultramicroscopy. 2014 Oct;145(100):13-21. doi: 10.1016/j.ultramic.2013.11.010. Epub 2013 Dec 1. Ultramicroscopy. 2014. PMID: 24315660 Free PMC article.

9

A journey from order to disorder - atom by atom transformation from graphene to a 2D carbon glass.

Eder FR, Kotakoski J, Kaiser U, Meyer JC. Eder FR, et al. Among authors: meyer jc. Sci Rep. 2014 Feb 11;4:4060. doi: 10.1038/srep04060. Sci Rep. 2014. PMID: 24515093 Free PMC article.

10

Imaging atomic-level random walk of a point defect in graphene.

Kotakoski J, Mangler C, Meyer JC. Kotakoski J, et al. Among authors: meyer jc. Nat Commun. 2014 May 29;5:3991. doi: 10.1038/ncomms4991. Nat Commun. 2014. PMID: 24874455 Free PMC article.

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