Simultaneous bright- and dark-field X-ray microscopy at X-ray free electron lasers.
Dresselhaus-Marais LE, Kozioziemski B, Holstad TS, Ræder TM, Seaberg M, Nam D, Kim S, Breckling S, Choi S, Chollet M, Cook PK, Folsom E, Galtier E, Gonzalez A, Gorkhover T, Guillet S, Haldrup K, Howard M, Katagiri K, Kim S, Kim S, Kim S, Kim H, Knudsen EB, Kuschel S, Lee HJ, Lin C, McWilliams RS, Nagler B, Nielsen MM, Ozaki N, Pal D, Pablo Pedro R, Saunders AM, Schoofs F, Sekine T, Simons H, van Driel T, Wang B, Yang W, Yildirim C, Poulsen HF, Eggert JH.
Dresselhaus-Marais LE, et al. Among authors: lee hj.
Sci Rep. 2023 Oct 16;13(1):17573. doi: 10.1038/s41598-023-35526-5.
Sci Rep. 2023.
PMID: 37845245
Free PMC article.