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Page 1
Radiation Damage by Heavy Ions in Silicon and Silicon Carbide Detectors.
Altana C, Calcagno L, Ciampi C, La Via F, Lanzalone G, Muoio A, Pasquali G, Pellegrino D, Puglia S, Rapisarda G, Tudisco S. Altana C, et al. Among authors: calcagno l. Sensors (Basel). 2023 Jul 19;23(14):6522. doi: 10.3390/s23146522. Sensors (Basel). 2023. PMID: 37514817 Free PMC article.
Single-Ion Counting with an Ultra-Thin-Membrane Silicon Carbide Sensor.
Sangregorio E, Calcagno L, Medina E, Crnjac A, Jakšic M, Vignati A, Romano F, Milluzzo G, De Napoli M, Camarda M. Sangregorio E, et al. Among authors: calcagno l. Materials (Basel). 2023 Dec 18;16(24):7692. doi: 10.3390/ma16247692. Materials (Basel). 2023. PMID: 38138833 Free PMC article.
Impact of Nitrogen on the Selective Closure of Stacking Faults in 3C-SiC.
Calabretta C, Scuderi V, Bongiorno C, Cannizzaro A, Anzalone R, Calcagno L, Mauceri M, Crippa D, Boninelli S, La Via F. Calabretta C, et al. Among authors: calcagno l. Cryst Growth Des. 2022 Aug 3;22(8):4996-5003. doi: 10.1021/acs.cgd.2c00515. Epub 2022 Jun 29. Cryst Growth Des. 2022. PMID: 35942119 Free PMC article.
Radiation Hardness of 4H-SiC P-N Junction UV Photo-Detector.
Sciuto A, Calcagno L, Di Franco S, Pellegrino D, Selgi LM, D'Arrigo G. Sciuto A, et al. Among authors: calcagno l. Materials (Basel). 2021 Dec 30;15(1):264. doi: 10.3390/ma15010264. Materials (Basel). 2021. PMID: 35009409 Free PMC article.
48 results