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Single-Ion Counting with an Ultra-Thin-Membrane Silicon Carbide Sensor.
Materials (Basel). 2023 Dec 18;16(24):7692. doi: 10.3390/ma16247692.
Materials (Basel). 2023.
PMID: 38138833
Free PMC article.
Radiation Hardness Study of Silicon Carbide Sensors under High-Temperature Proton Beam Irradiations.
Medina E, Sangregorio E, Crnjac A, Romano F, Milluzzo G, Vignati A, Jakšic M, Calcagno L, Camarda M.
Medina E, et al. Among authors: sangregorio e.
Micromachines (Basel). 2023 Jan 9;14(1):166. doi: 10.3390/mi14010166.
Micromachines (Basel). 2023.
PMID: 36677227
Free PMC article.
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Effect of the Oxidation Process on Carrier Lifetime and on SF Defects of 4H SiC Thick Epilayer for Detection Applications.
Meli A, Muoio A, Reitano R, Sangregorio E, Calcagno L, Trotta A, Parisi M, Meda L, La Via F.
Meli A, et al. Among authors: sangregorio e.
Micromachines (Basel). 2022 Jun 30;13(7):1042. doi: 10.3390/mi13071042.
Micromachines (Basel). 2022.
PMID: 35888859
Free PMC article.
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