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In situ compression of micropillars under coherent X-ray diffraction: a case study of experimental and data-analysis constraints.
Godard P, Verezhak M, Sadat T, Mignerot F, Jacques VLR, Le Bolloc'h D, Richter C, Berenguer F, Diaz A, Van Petegem S, Renault PO, Thilly L. Godard P, et al. Among authors: diaz a. J Appl Crystallogr. 2023 Feb 28;56(Pt 2):381-390. doi: 10.1107/S1600576723000493. eCollection 2023 Apr 1. J Appl Crystallogr. 2023. PMID: 37032969 Free PMC article.
Scanning X-ray strain microscopy of inhomogeneously strained Ge micro-bridges.
Etzelstorfer T, Süess MJ, Schiefler GL, Jacques VL, Carbone D, Chrastina D, Isella G, Spolenak R, Stangl J, Sigg H, Diaz A. Etzelstorfer T, et al. Among authors: diaz a. J Synchrotron Radiat. 2014 Jan;21(Pt 1):111-8. doi: 10.1107/S1600577513025459. Epub 2013 Nov 2. J Synchrotron Radiat. 2014. PMID: 24365924 Free PMC article.
Model-free classification of X-ray scattering signals applied to image segmentation.
Lutz-Bueno V, Arboleda C, Leu L, Blunt MJ, Busch A, Georgiadis A, Bertier P, Schmatz J, Varga Z, Villanueva-Perez P, Wang Z, Lebugle M, David C, Stampanoni M, Diaz A, Guizar-Sicairos M, Menzel A. Lutz-Bueno V, et al. Among authors: diaz a. J Appl Crystallogr. 2018 Sep 10;51(Pt 5):1378-1386. doi: 10.1107/S1600576718011032. eCollection 2018 Oct 1. J Appl Crystallogr. 2018. PMID: 30279640 Free PMC article.
Shearing interferometer for quantifying the coherence of hard x-ray beams.
Pfeiffer F, Bunk O, Schulze-Briese C, Diaz A, Weitkamp T, David C, van der Veen JF, Vartanyants I, Robinson IK. Pfeiffer F, et al. Among authors: diaz a. Phys Rev Lett. 2005 Apr 29;94(16):164801. doi: 10.1103/PhysRevLett.94.164801. Epub 2005 Apr 26. Phys Rev Lett. 2005. PMID: 15904233 Free article.
3,263 results