Crystalline Si Surface Passivation with Nafion for Bulk Defects Detection with Electron Paramagnetic Resonance.
Chen K, Johnston SW, Taylor PC, Mulder DW, Guthrey HL, Nemeth W, Theingi S, Page M, Kaupa M, Young DL, Agarwal S, Stradins P.
Chen K, et al. Among authors: young dl.
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ACS Appl Mater Interfaces. 2024.
PMID: 38650370