Atom-Vacancy-Defect-Derived Electric Hysteresis Loops and Stochastic Low-Frequency Noises in Few-Atom Layer MoS2.
Kosugi M, Furuichi S, Lin YC, Kobayashi Y, Takaki K, Kikkawa T, Taniguchi T, Watanabe K, Kohno T, Suenaga K, Saitoh E, Maruyama S, Haruyama J.
Kosugi M, et al. Among authors: furuichi s.
ACS Appl Mater Interfaces. 2024 Nov 20;16(46):64190-64196. doi: 10.1021/acsami.4c13147. Epub 2024 Nov 5.
ACS Appl Mater Interfaces. 2024.
PMID: 39499820