Dahmen U - Search Results

1

In situ measurement of dihedral angles at liquid grain boundary inclusions.

Gabrisch H, Dahmen U, Johnson E. Gabrisch H, et al. Among authors: dahmen u. Microsc Res Tech. 1998 Aug 15;42(4):241-7. doi: 10.1002/(SICI)1097-0029(19980915)42:4<241::AID-JEMT2>3.0.CO;2-T. Microsc Res Tech. 1998. PMID: 9779828

2

Nanoscale lead and noble gas inclusions in aluminum: structures and properties.

Johnson E, Andersen HH, Dahmen U. Johnson E, et al. Among authors: dahmen u. Microsc Res Tech. 2004 Aug;64(5-6):356-72. doi: 10.1002/jemt.20097. Microsc Res Tech. 2004. PMID: 15549703

3

In Situ Observations of the Interaction of Liquid Lead Inclusions with Grain Boundaries in Aluminum.

Gabrisch H, Dahmen U, Johnson E. Gabrisch H, et al. Among authors: dahmen u. Microsc Microanal. 1998 May;4(3):286-293. doi: 10.1017/s1431927698980291. Microsc Microanal. 1998. PMID: 9767666

4

Electron microscopy observations on the role of twinning in the evolution of microstructures.

Dahmen U, Hetherington CJ, Radmilovic V, Johnson E, Xiao SQ, Luo CP. Dahmen U, et al. Microsc Microanal. 2002 Aug;8(4):247-56. doi: 10.1017/s1431927602020184. Microsc Microanal. 2002. PMID: 12533222 Review.

5

Pb nanoprecipitates in Al: magic-shape effects due to elastic strain.

Hamilton JC, Léonard F, Johnson E, Dahmen U. Hamilton JC, et al. Among authors: dahmen u. Phys Rev Lett. 2007 Jun 8;98(23):236102. doi: 10.1103/PhysRevLett.98.236102. Epub 2007 Jun 5. Phys Rev Lett. 2007. PMID: 17677921

6

An in situ nanoindentation specimen holder for a high voltage transmission electron microscope.

Wall MA, Dahmen U. Wall MA, et al. Among authors: dahmen u. Microsc Res Tech. 1998 Aug 15;42(4):248-54. doi: 10.1002/(SICI)1097-0029(19980915)42:4<248::AID-JEMT3>3.0.CO;2-M. Microsc Res Tech. 1998. PMID: 9779829

7

Method for jet polishing two-phase materials.

Witcomb MJ, Dahmen U. Witcomb MJ, et al. Among authors: dahmen u. Microsc Res Tech. 1995 Sep 1;32(1):70-4. doi: 10.1002/jemt.1070320107. Microsc Res Tech. 1995. PMID: 8573775

8

Development of a Nanoindenter for In Situ Transmission Electron Microscopy.

Stach EA, Freeman T, Minor AM, Owen DK, Cumings J, Wall MA, Chraska T, Hull R, Morris JW, Zettl A, Dahmen U. Stach EA, et al. Among authors: dahmen u. Microsc Microanal. 2001 Nov;7(6):507-517. Microsc Microanal. 2001. PMID: 12597795

9

Chevron defect at the intersection of grain boundaries with free surfaces in Au.

Radetic T, Lançon F, Dahmen U. Radetic T, et al. Among authors: dahmen u. Phys Rev Lett. 2002 Aug 19;89(8):085502. doi: 10.1103/PhysRevLett.89.085502. Epub 2002 Aug 1. Phys Rev Lett. 2002. PMID: 12190479

10

A pattern recognition technique for the analysis of grain boundary structure by HREM.

Paciornik S, Kilaas R, Turner J, Dahmen U. Paciornik S, et al. Among authors: dahmen u. Ultramicroscopy. 1996 Jan;62(1-2):15-27. doi: 10.1016/0304-3991(95)00084-4. Ultramicroscopy. 1996. PMID: 22666914

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